TEST
We provide a Test Solution specializing in highly functional system semiconductor used
for cutting-edge IT devices with global top-level competitiveness in test services.
TEST Solutions
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- Pad Test
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- Bumping
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- Wafer Test
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- Assembly
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- Final Test
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- Final Product
Application & Portfolio
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SYSTEM IC
MCU SoC DSP, ISP AI Custom IC Audio
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PMIC (Power Management IC)
Mobile Phone LED Lighting Automotive Battery Charger SSD
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RF
Wireless Transceiver 5G RF
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DDI (Display Driver IC)
Monitor,
Laptop PC Mobile Phone,
Tablet PC LCD/OLED TV Automotive Display Panel
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CIS(CMOS Image Sensor)
Mobile Phone Laptop PC, Tablet PC Black Box Security Automotive
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IoT & Sensor
Controller Memory Touch Sensor Security MCU
TEST Total Solution Provider
Test Program Development
Wafer Probe Test
Probe card, PIB Development & Maintenance
Package Final Test
Intelligent IT system Infra support
Turn-key service(BUMP – TEST – PACKAGE)
System U/I Development
nepes Ark
Address587-32 Gwahaksaneop 2-ro Ochang-eup, Cheongwon-gu, Cheongju-si, Chungcheongbuk-do
Tel+82-43-240-0500 (Line 3)
E-mailsales@nepes.co.kr